期刊論文
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1.
PDF K. -M. Yang,
J. Y. Chung, and D.-S. Lin*, In situ Error Estimation for Topographic Height Measured from
Frequency-Modulated Atomic Force Microscopy, Jpn.
J. Appl. Phys. Vol.46, pp. 4395-4402(2007). |
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2.
PDF Ming-Feng
Hsieh, Jen-Yang Chung, Deng-Sung Lin*, and Shiow-Fon
Tsay, Correlation
of Reaction Sites during the Chlorine Extraction by Hydrogen atoms from Cl/Si(100)-2x1,
J. Chem. Phys. 127, 034708 (2007). |
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3.
PDF K.-M.
Yang, J. Y. Chung, M. F. Hsieh, S.-S. Ferng, D.-S.
Lin*, and T.C. Chiang, Systematic Variations in Apparent
Topographic Height as Measured by Non-contact Atomic Force Microscopy,
Phys. Rev. B 74, 193313 (2006) |
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4.
PDF Shyh-Shin Ferng,
Tsung-Hsi Yang, Guangli Luo, |
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5. PDF D.-S. Lin* and T.C. Chiang,: Lin and Chiang reply. Phys. Rev. Lett. 96, 209602 (
2006).
6. PDF
S.-S. Ferng, C.-T. Lin,
K.-M. Yang, M.-F. Hsieh, and D.-S. Lin*: Evolution of the Two-Dimensional Structure
Phase Transitions (3´1)→(2´1) and (1´1)→(2´1) on the Hydrogen
Terminated Si(100) Surface, Jpn. J. Appl. Phys.
45, 2197 (2006).
7. PDF S.-S. Ferng, C.-T. Lin, K.-M. Yang, D.-S. Lin* and T.C. Chiang, Atomistic
View of the Recombinative Desorption
of H2 from H/Si(100), Phys. Rev. Lett. 94, 196103
(2005).
8. PDF,
9. PDF
D.-S. Lin*,
10. PDF
M.-W. Wu, S.-Y. Pan, W.-H. Hung, and D.-S. Lin*, Thermal reactions on the Cl-terminated
SiGe(100),
Surf. Sci. 507, 295 (2002).
11. PDF Deng-Sung Lin*, Meng-Wen Wu,
and Shiang-Yuan Pan, Chlorine
Induced Si Surface Segregation on the Ge-terminated
Si/Ge(100) Surface from Core-level Photoemission,
Phys. Rev. B. 64, 233302 (2001).
12. PDF H.-W.
Tsai and D.-S. Lin*, Comparison of thermal
reactions of phosphine on Ge(100) and Si (100) by
high-resolution core-level photoemission, Surf. Sci. 482-485, 654-658 (2001).
13. Y.-C.
Pan, S. F. Wang, W.-H. Lee, W.C. Lin, C.-I. Chiang, H. Chang, H.H Hsieh, J.M.
Chen, D.-S. Lin, M.-C. Lee, W.-K. Chen, and W.-H.
Chen, Structural study of GN:Mg films by x-ray absorption near-edge structure
spectroscopy, SOLID STATE COMMUN 117: (10) 577-582 ( 2001).
14. Y.-C.
Pan, S. F. Wang, W.-H. Lee, M.-C. Lee, W.-K. Chen, W.-H. Chen, L.-Y. Jang, J.F.
Lee, C.-I. Chiang, H. Chang, K.-T. Wu, and, D.-S. Lin,
Gallium K-edge x-ray absorption study of Mg-doped GaN, APPL PHYS LETT 78: (1) 31-33 JAN 1( 2001).
15. PDF Ru-Ping Chen and Deng-Sung Lin, Distribution
of dangling bond pairs on partially hydrogen-terminated Si(100)
surface observed by scanning-tunneling-microscopy, Surf. Sci. 454, 196-200 (2000).
16. PDF
Deng-Sung Lin, Tsai-Shain Ku, and Ru-Ping
Chen, Interaction of phosphine
with Si(100) from core-level photoemission and real-time
scanning-tunneling-microscopy, Phys. Rev. B 61, 2799-2805
(2000).
17. PDF
Deng-Sung Lin and Ru-Ping Chen, Hydrogen desorption kinetic
measurement on the Si(100)-2x1:H surface by directly
counting desorption sites, Phys. Rev.
B60, R8461-8464 (1999).
18. PDF
Deng-Sung Lin, Tsai-Shain Ku, and Tzeng-Jiuh
Sheu, Thermal
reactions of phosphine with Si(100):
A combined photoemission and scanning-tunneling-microscopy study,
Surf. Sci., 424, 7(1999).
19. Y.-C.
Pan, W.-H. Lee, C.-K. Shu, H.-C. Lin, C.-I. Chiang,
H. Chang, D.-S. Lin, M.-C. Lee, and W.-K. Chen, Influence of sapphire nitridation on
properties of Indium Nitride Prepared by metalorganic
vapor phase epitaxy, Jpn. J. Appl. Phys. 38, 4016
(1999).
20. PDF Perng-Hung Wu and Deng-Sung Lin, Growth mode in Si(100)-(2x1) epitaxy by low-temperature chemical vapor deposition,
Phys. Rev. B15, 57, 12421-12427 (1998).
21. D.-S.
Lin, Scanning tunneling microscopy observation of
surface reconstruction of Si(100) during chemical vapor
deposition from Si2H6, Surf. Sci., 402, 831-835 (1998).
22. D.-S.
Lin and P.-H. Wu, Real-time scanning tunneling microscopy
observation of structural phase transition Si(100)-(2x1)→(2xn)→c(4x4),
Surf. Sci. Lett. 397, 273
(1998).
23. K.-S.
Huang, T.-S. Ku, and D.-S. Lin, Growth process of Ge on Si(100)-(2x1) in atomic-layer epitaxy
from Ge2H6, Phys. Rev. B56, 4878 (1997).
24. D.-S.
Lin, T. Miller, and T.-C. Chiang, Atomic-level
investigation of the growth of Si/Ge by UHV-CVD,
J. Vac. Sci. Technol. A15, 919-926 (1997).
25. D.-S.
Lin, K.-H. Huang, D.-W. Pi, and R.-T. Wu, Coverage-dependent thermal reactions of digermane
on Si(100)-(2x1), Phys. Rev.
B54, 16958-16964 (1996).
26. Hawoong Hong, R. D. Aburano,
K.-S. Chung, D.-S. Lin, E. S. Hirschorn, T.-C.
Chiang, and Haydn Chen, X-Ray Truncation rod
study of Ge(100) surface roughening by molecular beam homoepitaxial growth, J. Appl. Phys. 79, 6858-6864 (1996).
27. R.
D. Aburano, Hawoong Hong,
J.M. Roesler, K. Chung, D.-S. Lin, P. Zschack, Haydn Chen, and T.-C. Chiang, X-ray study of the Ag/Si(111) interface,
Surf. Sci. Lett. 339,
L891-896 (1995).
28. R.
D. Aburano, Hawoong Hong,
J.M. Roesler, K. Chung, D.-S. Lin, P. Zschack, Haydn Chen, and T.-C. Chiang, Boundary structure determination of Ag/Si(111)
interface by X-ray diffraction, Phys. Rev. B52, 1839-1847 (1995).
29. E.
S. Hirschorn, D.-S. Lin, E. D. Hanson, and T.-C.
Chiang, Atomic burrowing and hole formation for Au
growth on Ag(110), Surf. Sci. Lett. 323, L299-305 (1995).
30. M. Sieger, J. Roesler, D.-S. Lin, T.
Miller, and T.-C. Chiang, Holography of Ge(111)-c(2x8)
by surface core-level photoemission, Phys. Rev. Lett.
73, 3117-3120 (1994).
31. D.-S.
Lin, Hawoong Hong,T. Miller and T.-C. Chiang, Growth
and atomic structure of epitaxial Si films on Ge(111),
Surf. Sci. 312, 213-220 (1994).
32. R. Tsu, H. Z. Xiao, Y. W. Kim, M.-A. Hasan,
H. K. Birnbaum, J. E. Greene, D.-S. Lin, and T.-C. Chiang, Surface
segregation and growth-mode transitions during the initial stages of Si growth
on Ge(100)-(2x1)
by cyclic GSMBE from Si2H6, J. Appl. Phys. 75, 240-247 (1994).
33. D.-S.
Lin, E. S. Hirschorn, T. Miller, and T.-C. Chiang, Adsorption, thermal reaction, and desorption
of disilane on Ge(111)-c(2x8), Phys. Rev. B49, 1836-1843 (1994).
34. D.-S.
Lin, T. Miller, T.-C. Chiang, R. Tsu, and J. E.
Greene, Thermal reactions of disilane
on Si(100) studied by synchrotron-radiation photoemission,
Phys. Rev. B48, 11846-11850 (1993).
35. D.-S.
Lin, T. Miller, and T.-C. Chiang, Adsorption and
thermal reactions of disilane and the growth of Si
films on Ge(100)-(2x1), Phys. Rev. B47, 6543-6554 (1993).
36. R. Tsu, D. Lubben, T. R. Bramblett, J. E. Greene, D.-S. Lin and T.-C. Chiang, Adsorption and dissociation of Si2H6 on Ge(100)-(2x1),
Surf. Sci. 280, 265-276 (1993).
37. D.-S.
Lin, J. A. Carlisle, T. Miller, and T.-C. Chiang, Lin
et al. reply, Phys. Rev. Lett. 69, 552 (1992).
38. D.-S.
Lin, T. Miller, and T.-C. Chiang, Si indiffusion on Ge(100)-(2x1)
studied by core-level photoemission, Phys. Rev. B45, 11415-11418
(1992).
39. D.-S.
Lin, E. S. Hirschorn, T.-C. Chiang, R. Tsu, D. Lubben, and J. E. Greene,
Scanning-tunneling-microscopy studies of disilane
and pyroltyic growth on Si(100)-(2x1),
Phys. Rev. B45, 3494-3498 (1992).
40. Hawoong Hong, R. D. Aburano,
D.-S. Lin, Haydn Chen, and T.-C. Chiang, X-Ray
scattering study of Ag/Si(111) buried interface sturctures, Phys. Rev. Lett.
68, 507-510 (1992).
41. Hawoong Hong, W. E. McMahon, D.-S. Lin,
R. D. Aburano, Haydn Chen, T.-C. Chiang, and P. Zschack, C60
encapsulation of the Si(111)-(7x7) surface, Appl. Phys. Lett. 61, 3127-3130
(1992).
42. D.-S.
Lin, T. Miller, and T.-C. Chiang, Bonding of Cs on
Si and Ge surfaces studied by core-level spectroscopy,
Phys. Rev. B44, 10719-10723 (1991).
43. D.-S.
Lin T. Miller, and T.-C. Chiang, Dimer charge asymmetry determined by photoemission from epitaxial Ge on Si(100)-(2x1), Phys. Rev. Lett.
67, 2187-2190 (1991).
44. E.
S. Hirschorn, D.-S. Lin, F. M. Leibsle,
A. Samsavar, and T.-C. Chiang, Charge transfer and asymmetry on Ge(111)-c(2x8)
studied by scanning tunneling microscopy,
Phys. Rev. B44, 1403 (1991).
45.
46.
B.研討會論文
R. Tsu, D.-S.
Lin, J.E. Greene, and T.-C. Chiang, Ge segregation and surface roughening during Si growth on Ge(100)-2x1
by gas-source molecular beam epitaxy from Si2H6,
Mat. Res. Soc. Proc. Vol. 280, 281(1993).